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    INSPECTION DEVICE FOR SCANNING AND INSPECTING OBJECT BEING INSPECTED
    2.
    发明公开
    INSPECTION DEVICE FOR SCANNING AND INSPECTING OBJECT BEING INSPECTED 审中-实审

    公开(公告)号：EP4414695A1

    公开(公告)日：2024-08-14

    申请号：EP22877901.3

    申请日：2022-09-29

    申请人： Nuctech Company Limited

    发明人： CHEN, Zhiqiang ,  ZHANG, Li ,  HUANG, Qingping ,  JIN, Xin ,  CHANG, Ming ,  HONG, Mingzhi ,  ZHANG, Liguo

    IPC分类号： G01N23/046 ,  G01N23/02

    CPC分类号： G01V5/00 ,  G01N23/046 ,  G01N23/02 ,  G01N23/04

    摘要： An inspection device used for scanning and inspecting an object to be inspected (2), includes: an inspection channel (1), where the object to be inspected (2) enters and exits the inspection device through the inspection channel (1); an imaging system (6) used to scan and inspect the object to be inspected (2), where the imaging system (6) includes a radiation source (6S) used to generate a ray, where the radiation source (6S) is disposed on one side of the inspection channel (1), and the ray at least forms a main beam surface (61) applicable to scan and inspect the object to be inspected (2); and a detector (6T) used to receive the ray passing through the object to be inspected (2), where the detector (6T) is disposed on the other side of the inspection channel (1) to form an inspection region (63) between the radiation source (6S) and the detector (6T); and a posture adjustment structure (4) disposed in the inspection region (63) and used to adjust a posture of the object to be inspected (2) located in the inspection region (63). The object to be inspected (2) has an inspection surface (21). The posture adjustment structure (4) may adjust the posture of the object to be inspected (2), so that the inspection surface (21) and the main beam surface (61) are in the same plane.

    CHECK SYSTEM AND METHOD
    5.
    发明公开
    CHECK SYSTEM AND METHOD 审中-实审

    公开(公告)号：EP4369056A1

    公开(公告)日：2024-05-15

    申请号：EP22836955.9

    申请日：2022-07-06

    申请人： Tsinghua University ,  Nuctech Company Limited

    发明人： CHEN, Zhiqiang ,  ZHANG, Li ,  HUANG, Qingping ,  ZHOU, Yong ,  DING, Hui ,  JIN, Xin ,  JI, Chao

    IPC分类号： G01V5/00

    摘要： Provided are an inspection method, and an inspection system including: at least one ray source (100); a detector assembly (200) and a conveying device (300) for carrying a to-be-inspected object (10). At least one ray source (100) and the detector assembly (200) may move in a traveling direction relative to the conveying device (300), so that the to-be-inspected object (10) may enter an inspection region (30). When viewed along a central axis (AX) of the inspection region (30), at least one ray source (100) may translate between scanning positions, and a translation distance of at least one ray source (100) between two adjacent scanning positions is greater than a spacing between adjacent target spots (120) of each ray source (100). When at least one ray source (100) is located at one scanning position, at least one ray source (100) and the detector assembly (200) move in the traveling direction relative to the conveying device (300) and at least one ray source (100) emits X-rays. After moving a predetermined distance, at least one ray source (100) translates to another scanning position.

    INSPECTION SYSTEM AND METHOD
    6.
    发明公开
    INSPECTION SYSTEM AND METHOD 审中-实审

    公开(公告)号：EP4365641A1

    公开(公告)日：2024-05-08

    申请号：EP22836961.7

    申请日：2022-07-06

    申请人： Nuctech Company Limited ,  Tsinghua University

    发明人： ZHANG, Li ,  CHEN, Zhiqiang ,  HUANG, Qingping ,  DING, Hui ,  ZHOU, Yong ,  JIN, Xin ,  YAO, Liming

    IPC分类号： G01V5/00 ,  G01N23/046

    CPC分类号： G01V5/00 ,  G01N23/046

    摘要： An inspection system and method, the inspection system includes: a carrying device, at least one ray source (100) and a detector assembly (200). The at least one ray source (100) and the detector assembly (200) are lifted or lowered along a central axis of the carrying device (300) relative to the carrying device (300). When viewed along the central axis, the at least one ray source (100) is translatable between a plurality of scanning positions relative to the carrying device (300). When the at least one ray source (100) is at one of the scanning positions relative to the carrying device (300), the at least one ray source (100) and the detector assembly (200) are lifted or lowered relative to the carrying device (300) along the central axis, and the at least one ray source (100) emits X-rays; and when the at least one ray source (100) and the detector assembly (200) are lifted or lowered a predetermined distance relative to the carrying device (300), the at least one ray source (100) translates to another one of the scanning positions relative to the carrying device (300). The inspection system further reconstructs a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly (200).