- 专利标题: CONTROL DEVICE, CONTROL METHOD, AND CONTROL PROGRAM
-
申请号: EP17197340.7申请日: 2017-10-19
-
公开(公告)号: EP3349077A1公开(公告)日: 2018-07-18
- 发明人: YAMADA, Takaaki , TANAKA, Hitoshi , TSUBATA, Hajime , YAMAGUCHI, Shohei , HASUI, Ryosuke
- 申请人: Omron Corporation
- 申请人地址: 801 Minamifudodo-cho Horikawahigashiiru Shiokoji-dori Shimogyo-ku Kyoto-shi, Kyoto 600-8530 JP
- 专利权人: Omron Corporation
- 当前专利权人: Omron Corporation
- 当前专利权人地址: 801 Minamifudodo-cho Horikawahigashiiru Shiokoji-dori Shimogyo-ku Kyoto-shi, Kyoto 600-8530 JP
- 代理机构: Becker Kurig Straus
- 优先权: JP2017002459 20170111
- 主分类号: G05B13/02
- IPC分类号: G05B13/02
摘要:
A temperature adjustment device 10 includes a PID calculation part 12 for calculating a PID value, a PID control part 14, and a determination part 15. The PID control part 14 performs PID control and calculate an amount of manipulation for a control target using the PID value, a target value of the control target, and an actually measured value of the control target. The determination part 15 determines whether or not to stop calculation of the PID value using a combination of the target value and the actually measured value or the PID value. This suppresses control performance degradation of PID control.
信息查询