Invention Publication
- Patent Title: METHOD AND APPARATUS FOR EXTENDING ANGULAR COVERAGE FOR A SCANNING TWO-DIMENSIONAL X-RAY DETECTOR
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Application No.: EP18165543.2Application Date: 2018-04-03
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Publication No.: EP3385705A1Publication Date: 2018-10-10
- Inventor: He, Bob Boaping
- Applicant: Bruker AXS, Inc.
- Applicant Address: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
- Assignee: Bruker AXS, Inc.
- Current Assignee: Bruker AXS, Inc.
- Current Assignee Address: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
- Agency: Kohler Schmid Möbus Patentanwälte
- Priority: US201715479335 20170405
- Main IPC: G01N23/207
- IPC: G01N23/207
Abstract:
A method and apparatus for performing an X-ray diffraction measurement with a diffractometer having an X-ray beam directed at a sample and a two-dimensional X-ray detector includes the performance of a physical scan during which the detector is moved through a scanning range in an angular direction about the sample position. To provide a uniform exposure time, the detector, when located at an extreme of the scanning range, is controlled to progressively change the portion of the detected X-ray energy that is used at a rate that maintains a uniform exposure time for each angular position in the scanning range. Alternatively, when located at an extreme of the range, the detector is kept stationary until a desired minimum exposure time is obtained for each angular position, after which the collected diffraction data is normalized relative to exposure time.
Public/Granted literature
- EP3385705B1 METHOD AND APPARATUS FOR EXTENDING ANGULAR COVERAGE FOR A SCANNING TWO-DIMENSIONAL X-RAY DETECTOR Public/Granted day:2020-01-01
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