- 专利标题: X-RAY IMAGING DATA PROCESSING DEVICE AND METHOD
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申请号: EP18718705.9申请日: 2018-03-23
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公开(公告)号: EP3442423A1公开(公告)日: 2019-02-20
- 发明人: BARTELS, Mattias , KOEHLER, Thomas , ROESSL, Ewald
- 申请人: Koninklijke Philips N.V.
- 申请人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 代理机构: Versteeg, Dennis John
- 优先权: EP17162475 20170323
- 国际公布: WO2018172501 20180927
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
The invention is related to processing x-ray imaging data, specifically phase contrast x-ray imaging data, and addresses the problems associated, for example, with vibrations in grating-based differential phase contrast imaging by making use of spectral information. It was realized that one may make use of the spectral information in determining the vibration state of the Moire pattern based on multi-energy-bin x-ray detectors, the energy independence of vibration-induced Moire pattern phase shifts, the energy dependence of object-induced Moire pattern phase shifts and a phantom designed to allow for measuring the dependence of the object-induced phase shift as a function of the energy bin. In particular, it was found that by suitable data processing the vibration-induced shifts and the like can be disentangled from the object properties and hence vibration artifacts in the image are reduced, while there is no particular need for changing the basic physical structure of the imaging device.
公开/授权文献
- EP3442423B1 X-RAY IMAGING DATA PROCESSING DEVICE AND METHOD 公开/授权日:2019-09-04
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