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    X-RAY IMAGING DATA PROCESSING DEVICE AND METHOD
    8.
    发明公开
    X-RAY IMAGING DATA PROCESSING DEVICE AND METHOD 审中-公开

    公开(公告)号：EP3378396A1

    公开(公告)日：2018-09-26

    申请号：EP17162475.2

    申请日：2017-03-23

    申请人： Koninklijke Philips N.V.

    发明人： BARTELS, Matthias ,  KOEHLER, Thomas ,  ROESSL, Ewald

    IPC分类号： A61B6/00

    CPC分类号： A61B6/484 ,  A61B6/583

    摘要： The invention is related to processing x-ray imaging data, specifically phase contrast x-ray imaging data, and addresses the problems associated, for example, with vibrations in grating-based differential phase contrast imaging by making use of spectral information. It was realized that one may make use of the spectral information in determining the vibration state of the Moire pattern based on multi-energy-bin x-ray detectors, the energy independence of vibration-induced Moire pattern phase shifts, the energy dependence of object-induced Moire pattern phase shifts and a phantom designed to allow for measuring the dependence of the object-induced phase shift as a function of the energy bin. In particular, it was found that by suitable data processing the vibration-induced shifts and the like can be disentangled from the object properties and hence vibration artifacts in the image are reduced, while there is no particular need for changing the basic physical structure of the imaging device.

    CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
    10.
    发明授权
    CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING 有权
    扫描相位对比成像中的校正

    公开(公告)号：EP3013233B1

    公开(公告)日：2017-11-15

    申请号：EP14733637.4

    申请日：2014-06-27

    申请人： Koninklijke Philips N.V.

    发明人： ROESSL, Ewald ,  MARTENS, Gerhard

    IPC分类号： A61B6/00 ,  G01N23/20 ,  G21K1/06 ,  G02B5/18

    CPC分类号： A61B6/582 ,  A61B6/484 ,  A61B6/5258 ,  A61B6/583 ,  G01N23/20075 ,  G01N2223/303 ,  G02B5/1838 ,  G21K1/06 ,  G21K1/10 ,  G21K2207/005

    摘要： The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).