Invention Publication
- Patent Title: CT INSPECTION SYSTEM AND CT IMAGING METHOD
-
Application No.: EP19150074.3Application Date: 2019-01-02
-
Publication No.: EP3505977A1Publication Date: 2019-07-03
- Inventor: KANG, Kejun , LI, Jianmin , NI, Xiulin , LI, Yulan , LI, Yuanjing , CHEN, Zhiqiang , ZHANG, Li , LI, Liang , ZOU, Xiang , YU, Weifeng , ZHOU, Hejun , ZONG, Chunguang
- Applicant: Tsinghua University , Nuctech Company Limited
- Applicant Address: Qing Hua Yuan Haidian District Beijing 100084 CN
- Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee Address: Qing Hua Yuan Haidian District Beijing 100084 CN
- Agency: Held, Stephan
- Priority: CN201711451912 20171228
- Main IPC: G01V5/00
- IPC: G01V5/00
Abstract:
The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device, and generates a CT image based on the detection data and the rotational position of the detection device each time the radioactive source device emits a beam. The present disclosure can accurately determine the rotational position of the detection device each time the radioactive source device emits a beam, so that it is possible to effectively reduce the image deformation and improve the accuracy of detection results.
Public/Granted literature
- EP3505977B1 CT INSPECTION SYSTEM AND CT IMAGING METHOD Public/Granted day:2023-11-29
Information query