CT INSPECTION SYSTEM AND CT IMAGING METHOD
    1.
    发明公开

    公开(公告)号:EP3505977A1

    公开(公告)日:2019-07-03

    申请号:EP19150074.3

    申请日:2019-01-02

    IPC分类号: G01V5/00

    摘要: The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device, and generates a CT image based on the detection data and the rotational position of the detection device each time the radioactive source device emits a beam. The present disclosure can accurately determine the rotational position of the detection device each time the radioactive source device emits a beam, so that it is possible to effectively reduce the image deformation and improve the accuracy of detection results.

    CT INSPECTION SYSTEM AND CT IMAGING METHOD
    2.
    发明公开

    公开(公告)号:EP3505978A1

    公开(公告)日:2019-07-03

    申请号:EP19150075.0

    申请日:2019-01-02

    IPC分类号: G01V5/00

    摘要: The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.

    MULTI-RAY SOURCE INSPECTION DEVICE AND INSPECTION METHOD

    公开(公告)号:EP4459332A1

    公开(公告)日:2024-11-06

    申请号:EP22914540.4

    申请日:2022-12-23

    IPC分类号: G01V5/00 G01N23/04

    摘要: Provided is a multi-ray source inspection apparatus, including: a first inspection device (10) configured to acquire a two-dimensional first transmission image of an inspected object and a second inspection device (20) configured to acquire a second transmission image of the inspected object including three-dimensional information. A first radiation beam and a second radiation beam are emitted in a time-sharing manner, and the two-dimensional first transmission image and the second transmission image including the three-dimensional information are respectively acquired after the inspected object passes an inspection channel once. An inspection method using multiple ray sources is further provided.