- 专利标题: ANALOG TO DIGITAL CONVERTOR (ADC) USING A COMMON INPUT STAGE AND MULTIPLE PARALLEL COMPARATORS
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申请号: EP19162693.6申请日: 2019-03-13
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公开(公告)号: EP3562041A1公开(公告)日: 2019-10-30
- 发明人: EITAN, Roee , LIVNE, Ram , KHAIRI, Ahmad , KRUPNIK, Yoel , COHEN, Ariel
- 申请人: INTEL Corporation
- 申请人地址: 2200 Mission College Blvd. Santa Clara, CA 95054 US
- 专利权人: INTEL Corporation
- 当前专利权人: INTEL Corporation
- 当前专利权人地址: 2200 Mission College Blvd. Santa Clara, CA 95054 US
- 代理机构: HGF Limited
- 优先权: US201815961460 20180424
- 主分类号: H03M1/46
- IPC分类号: H03M1/46 ; H03M1/40 ; H03K3/356
摘要:
An Analog to Digital (ADC) is provided, where the ADC may include a sample and hold circuitry to sample an analog input signal, and a summation block to iteratively generate a subtraction signal. The subtraction signal may be based on a difference between the analog input signal and a feedback signal. The ADC may further include a common input stage to receive the subtraction signal, and a plurality of comparison and latch circuitries arranged in parallel, where individual ones of the plurality of parallel comparison and latch circuitries may sequentially receive an output of the common input stage.
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