• 专利标题: APPARATUS, SYSTEM AND METHOD OF MONITORING AN ADDITIVE MANUFACTURING ENVIRONMENT
  • 申请号: EP18864262.3
    申请日: 2018-10-03
  • 公开(公告)号: EP3691871A2
    公开(公告)日: 2020-08-12
  • 发明人: MACNEISH, WilliamGJOVIK, Erik
  • 申请人: Jabil Inc.
  • 申请人地址: 10560 Dr. Martin Luther King Jr. Street, N. St. Petersburg, Florida 33716 US
  • 专利权人: Jabil Inc.
  • 当前专利权人: Jabil Inc.
  • 当前专利权人地址: 10560 Dr. Martin Luther King Jr. Street, N. St. Petersburg, Florida 33716 US
  • 代理机构: Gulde & Partner
  • 优先权: US201715723891 20171003
  • 国际公布: WO2019070909 20190411
  • 主分类号: B29C64/393
  • IPC分类号: B29C64/393 G06Q50/04 B33Y50/02 B33Y10/00
APPARATUS, SYSTEM AND METHOD OF MONITORING AN ADDITIVE MANUFACTURING ENVIRONMENT
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