- 专利标题： CRYSTALLINITY MEASUREMENT DEVICE, RESIN-CONTAINING-MATERIAL PRODUCTION DEVICE, CRYSTALLINITY MEASUREMENT METHOD, AND RESIN-CONTAINING-MATERIAL PRODUCTION METHOD
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申请号： EP19864020.3申请日： 2019-09-20
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公开(公告)号： EP3835762A1公开(公告)日： 2021-06-16
- 发明人: KAMIHARA, Nobuyuki , ISHIKAWA, Naomoto , TAKAGI, Kiyoka , KAMO, Sota , YAMAGUCHI, Makoto , JIKEI, Mitsutoshi , MATSUMOTO, Kazuya , MURAOKA, Mikio
- 申请人： MITSUBISHI HEAVY INDUSTRIES, LTD. , Akita University
- 申请人地址： JP Chiyoda-ku, Tokyo 100-8332 2-3, Marunouchi 3-Chome,; JP Akita-shi Akita 010-8502 1-1, Tegata Gakuen-Machi
- 代理机构： Hoffmann Eitle
- 优先权： JP2018183782 20180928
- 国际公布： WO2020066940 20200402
- 主分类号： G01N21/65
- IPC分类号： G01N21/65
摘要：
Provided are a crystallinity measurement device, a resin-containing material manufacturing device, a crystallinity measurement method, and a resin-containing material manufacturing method capable of calculating crystallinity easily and accurately even when materials other than crystalline thermoplastic resin are included in addition to crystalline thermoplastic resin. A crystallinity measurement device 10 includes a Raman spectroscopy unit 11 and an analysis unit 13. The Raman spectroscopy unit 11 acquires a Raman spectrum of resin-containing material 1 including crystalline thermoplastic resin. The analysis unit 13 calculates the crystallinity of the crystalline thermoplastic resin based on the intensity of a low-wavenumber spectrum that is a spectrum in a region of less than 600 cm -1 , in the Raman spectrum.
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