- 专利标题: STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD
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申请号: EP22160172.7申请日: 2022-03-04
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公开(公告)号: EP4151995A1公开(公告)日: 2023-03-22
- 发明人: Usui, Takashi , Takamine, Hidefumi , Ueda, Yuki , Ueno, Keisuke , Hisakuni, Yousuke , Watabe, Kazuo
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Minato-ku Tokyo 105-0023 1-1, Shibaura 1-chome
- 代理机构: Hoffmann Eitle
- 优先权: JP2021151057 20210916
- 主分类号: G01N29/04
- IPC分类号: G01N29/04 ; G01N29/14
摘要:
According to one embodiment, a structure evaluation system includes at least three or more sensors, a position locator, and an evaluator. The three or more sensors are arranged on surfaces different from a surface to which an impact is applied with respect to a structure at different intervals in a first direction of the structure and a second direction orthogonal to the first direction and detects elastic waves generated from the structure. The position locator locates a position of a source in which the elastic waves are generated on the basis of the elastic waves detected by each of the three or more sensors. The evaluator evaluates a deterioration state of the structure on the basis of information based on a position location process of the position locator and information indicating a position where the impact is applied.
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