- 专利标题: MEASUREMENT REPORT METHOD FOR FREQUENCY SELECTION OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
-
申请号: EP22749974.6申请日: 2022-01-28
-
公开(公告)号: EP4277168A1公开(公告)日: 2023-11-15
- 发明人: KIM, Junsuk , LEE, Hyoungjoo , YANG, Minho , HAN, Yonggue , KIM, Taeyoon , JUNG, Euichang , LIM, Chaiman
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si, Gyeonggi-do 16677 129, Samsung-ro Yeongtong-gu
- 代理机构: HGF
- 优先权: KR20210016635 20210205
- 国际公布: WO2022169224 20220811
- 主分类号: H04B17/318
- IPC分类号: H04B17/318 ; H04B17/336 ; H04W24/10 ; H04L5/00
摘要:
An electronic device according to various embodiments comprises a memory and at least one communication processor, the at least one communication processor capable of controlling to: confirm a plurality of predetermined measurement objects (MOs) for measuring the downlink performance of a second communication network, while connected to a first base station of a first communication network; confirm measurement priorities of the plurality of predetermined MOs on the basis of at least information relating to the transmission/reception performance of signals having a frequency corresponding to the respective plurality of MOs and stored in the memory; measure the reception signal strength with respect to at least one MO from a signal transmitted from a second base station of the second communication network, on the basis of the measurement priorities of the plurality of MOs; and transmit at least one measurement report (MR) to the first base station of the first communication network, on the basis of the measurement result of the reception signal strength with respect to the at least one MO. Various other embodiments are possible.
信息查询