- 专利标题: CIRCUIT FOR CONTROLLING THE SLEW RATE OF A TRANSISTOR
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申请号: EP23196216.8申请日: 2023-09-08
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公开(公告)号: EP4354733A2公开(公告)日: 2024-04-17
- 发明人: Sharma, Santosh
- 申请人: GlobalFoundries U.S. Inc.
- 申请人地址: US Malta, NY 12020 400 Stonebreak Road Extension
- 专利权人: GlobalFoundries U.S. Inc.
- 当前专利权人: GlobalFoundries U.S. Inc.
- 当前专利权人地址: US Malta, NY 12020 400 Stonebreak Road Extension
- 代理机构: Grünecker Patent- und Rechtsanwälte PartG mbB
- 优先权: US 202218045909 2022.10.12
- 主分类号: H03K17/16
- IPC分类号: H03K17/16 ; H03K17/687
摘要:
Disclosed are circuits for controlling slew rate of a transistor during switching. Each circuit includes a first transistor (e.g., a gallium nitride (GaN)-based high electron mobility transistor (HEMT) or metal-insulator-semiconductor HEMT (MISHEMT)), a capacitor, and a second transistor. The first transistor includes a first gate connected to a pad for receiving a pulse-width modulation (PWM) signal, a first drain region connected to a first plate of the capacitor, and a first source region. The second transistor includes a second gate connected to a second plate of the capacitor, a second drain region, and a second source region and is connected to both the pad and the first transistor. The connection between the first and second transistors varies depending on whether the first transistor is an enhancement or depletion mode device and on whether the slew rate control is employed for on state or off state switching.
公开/授权文献
- EP4354733A3 CIRCUIT FOR CONTROLLING THE SLEW RATE OF A TRANSISTOR 公开/授权日:2024-05-29
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