发明公开
- 专利标题: METHODS AND DEVICES FOR CALIBRATING AND/OR MONITORING OPTICAL MEASUREMENT DEVICES
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申请号: EP24168644.3申请日: 2016-06-08
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公开(公告)号: EP4372366A3公开(公告)日: 2024-07-24
- 发明人: HAGEN, Norbert , OPALSKY, David , WALKER, George T. , KNIGHT, Byron J.
- 申请人: Gen-Probe Incorporated
- 申请人地址: US San Diego, CA 92121 10210 Genetic Center Drive
- 专利权人: Gen-Probe Incorporated
- 当前专利权人: Gen-Probe Incorporated
- 当前专利权人地址: US San Diego, CA 92121 10210 Genetic Center Drive
- 代理机构: Script IP Limited
- 优先权: US 1562173045P 2015.06.09
- 分案原申请号: 16730200.9 2016.06.08
- 主分类号: G01N21/27
- IPC分类号: G01N21/27 ; G01N21/64
摘要:
There is described a method for calibrating or monitoring performance of an optical measurement device using an optical reference material that emits a reference emission: (a) moving, using a robotic arm, a first reference device comprising an optical reference material into a signal-detecting position of the optical measurement device; (b) detecting, using the optical measurement device, an emission emitted by the optical reference material of the first reference device in the signal-detecting position; (c) generating a reference signal representing a characteristic of the emission detected by the optical measurement device; and (d) comparing the reference signal to an expected reference signal for the emission to calibrate or monitor the performance of the optical measurement device; preferably, wherein the optical measurement device comprises a fluorometer.
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