- 专利标题: METHOD OF SELECTIVELY FORMING LAYER USING ATOMIC LAYER DEPOSITION AND METHOD OF FORMING INTERCONNECT OF SEMICONDUCTOR DEVICE USING THE SAME
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申请号: EP23216580.3申请日: 2023-12-14
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公开(公告)号: EP4389930A3公开(公告)日: 2024-08-14
- 发明人: CHO, Eunhyoung , LEE, Sunghee , LEE, Jeongyub , LEE, Hanboram
- 申请人: Samsung Electronics Co., Ltd. , Incheon National University Research & Business Foundation
- 申请人地址: KR Suwon-si, Gyeonggi-do 16677 129, Samsung-ro Yeongtong-gu
- 专利权人: Samsung Electronics Co., Ltd.,Incheon National University Research & Business Foundation
- 当前专利权人: Samsung Electronics Co., Ltd.,Incheon National University Research & Business Foundation
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do 16677 129, Samsung-ro Yeongtong-gu
- 代理机构: Elkington and Fife LLP
- 优先权: KR 220179866 2022.12.20
- 主分类号: C23C16/02
- IPC分类号: C23C16/02 ; C23C16/04 ; C23C16/18 ; C23C16/34 ; C23C16/455 ; C23C16/56
摘要:
A method of selectively forming a layer according to atomic layer deposition includes providing a substrate which includes a first region consisting of a first material and having a first surface and a second region consisting of a second material and having a second surface, forming a first reaction inhibition layer on the second surface using a reaction inhibitor selectively adsorbed on the second surface, selectively forming a first deposition layer on the first surface using a first precursor and a first reactant, wherein the first reactant reacts with the first precursor to form an atomic layer and does not react with the reaction inhibitor to form the atomic layer, and converting the first reaction inhibition layer on the second surface into a second deposition layer using a second reactant which reacts with the first reaction inhibition layer to form the atomic layer.
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