- 专利标题: TECHNIQUE FOR ALIGNING PARTICLES ON SUBSTRATE WITHOUT AGGLOMERATION
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申请号: EP22861471.5申请日: 2022-08-26
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公开(公告)号: EP4394382A1公开(公告)日: 2024-07-03
- 发明人: TAKEUCHI, Toshifumi , SUNAYAMA, Hirobumi , TAKANO, Eri , HORIKAWA, Ryo
- 申请人: National University Corporation Kobe University
- 申请人地址: JP Kobe-shi, Hyogo 657-8501 1-1, Rokkodai-cho Nada-ku
- 专利权人: National University Corporation Kobe University
- 当前专利权人: National University Corporation Kobe University
- 当前专利权人地址: JP Kobe-shi, Hyogo 657-8501 1-1, Rokkodai-cho Nada-ku
- 代理机构: Weickmann & Weickmann PartmbB
- 优先权: JP 21139398 2021.08.27
- 国际申请: JP2022032269 2022.08.26
- 国际公布: WO2023027183 2023.03.02
- 主分类号: G01N33/543
- IPC分类号: G01N33/543 ; C12M1/34 ; C12N15/11
摘要:
Provided is a novel technique for providing a substrate advantageous when producing a sensor for analysis. The substrate for producing a sensor for analysis provided in the present disclosure has specific characteristics (for example, monodispersion, a single layer, or a specific density), such that it is possible to produce a sensor for analysis that is stable and enables highly accurate analysis. In the present disclosure, it is not required to remove excess fine particles after arranging the fine particles on the substrate, reproducibility of the density of the fine particles immobilized on the substrate is improved, and monodispersibility and single-layer properties are also improved.
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