- 专利标题: HIGH-RESOLUTION THREE-DIMENSIONAL SCANNING METHOD AND SYSTEM USING REAL-TIME ACQUISITION OF SURFACE NORMALS
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申请号: EP23753184.3申请日: 2023-02-09
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公开(公告)号: EP4407276A1公开(公告)日: 2024-07-31
- 发明人: KIM, Min Hyuk , HA, Hyunho
- 申请人: Korea Advanced Institute of Science and Technology
- 申请人地址: KR Daejeon 34141 291, Daehak-ro, Yuseong-gu
- 专利权人: Korea Advanced Institute of Science and Technology
- 当前专利权人: Korea Advanced Institute of Science and Technology
- 当前专利权人地址: KR Daejeon 34141 291, Daehak-ro, Yuseong-gu
- 代理机构: Boco IP Oy Ab
- 优先权: KR 220017271 2022.02.10
- 国际申请: KR2023001925 2023.02.09
- 国际公布: WO2023153837 2023.08.17
- 主分类号: G01B11/25
- IPC分类号: G01B11/25 ; G01B11/02 ; G06T7/50 ; G06T7/90 ; G06T17/30
摘要:
Disclosed is a high-resolution three-dimensional (3D) scanning method and system that may acquire high-detail geometry by connecting a volumetric fusion and multiview shape-from-shaping (SfS) in two stages and may include estimating an illumination and acquiring a scalar depth value; estimating a photometric normal and a diffuse albedo using the scalar depth value acquired from the estimated illumination; and integrating the scalar depth value to a volumetric distance field, refining the photometric normal and the diffuse albedo, and blending the photometric normal and the diffuse albedo in a texture space.
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