专利检索 ap:("Korea Advanced Institute of Science AND Technology") AND inv:"HA, Hyunho" 第 1 页

1.

发明公开
HIGH-RESOLUTION THREE-DIMENSIONAL SCANNING METHOD AND SYSTEM USING REAL-TIME ACQUISITION OF SURFACE NORMALS 审中-实审

公开(公告)号：EP4407276A1

公开(公告)日：2024-07-31

申请号：EP23753184.3

申请日：2023-02-09

申请人： Korea Advanced Institute of Science and Technology

发明人： KIM, Min Hyuk , HA, Hyunho

IPC分类号： G01B11/25 , G01B11/02 , G06T7/50 , G06T7/90 , G06T17/30

CPC分类号： G01B11/02 , G06T7/50 , G06T17/30 , G06T7/90 , G01B11/25

摘要： Disclosed is a high-resolution three-dimensional (3D) scanning method and system that may acquire high-detail geometry by connecting a volumetric fusion and multiview shape-from-shaping (SfS) in two stages and may include estimating an illumination and acquiring a scalar depth value; estimating a photometric normal and a diffuse albedo using the scalar depth value acquired from the estimated illumination; and integrating the scalar depth value to a volumetric distance field, refining the photometric normal and the diffuse albedo, and blending the photometric normal and the diffuse albedo in a texture space.