assignment
There is provided an improvement that realizes improvement in the efficiency of inspection and sorting operation of chip electronic components using a chip electronic component inspection and sorting device requiring high-speed inspection and sorting of microchip electronic components and suppresses the occurrence of deterioration in inspection precision.
Solution
A chip electronic component conveying disk rotatably supported by the base and the base, a component supply receiving part that supplies and accommodates the chip electronic components through the hole of the conveying disk, formed in sequence along the rotation path of the conveying disk, and the electrical characteristics of the chip electronic components A chip electronic component inspection and sorting device comprising an inspection unit of, and a classification unit of the chip electronic component that has been inspected, between a rear end position of a chip electronic component supply receiving unit and a front end position of the inspection unit, and at a position along a rotation path of a conveyance disk, An apparatus, characterized in that a chip electronic component removing means is provided for disengaging a chip electronic component whose reception state in the hole is not normal from the hole.