- Patent Title: Measurement device for obtaining amplitude information of an object
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Application No.: US14784744Application Date: 2014-03-20
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Publication No.: US10001405B2Publication Date: 2018-06-19
- Inventor: Yasuhiro Awatsuji , Peng Xia
- Applicant: NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY
- Applicant Address: JP Kyoto
- Assignee: National University Corporation Kyoto Institute of Technology
- Current Assignee: National University Corporation Kyoto Institute of Technology
- Current Assignee Address: JP Kyoto
- Agency: MH2 Technology Law Group, LLP
- Priority: JP2013-085624 20130416
- International Application: PCT/JP2014/057701 WO 20140320
- International Announcement: WO2014/171256 WO 20141023
- Main IPC: H01L27/00
- IPC: H01L27/00 ; G01J1/04 ; G01B11/24 ; G02B21/00 ; G01J1/44 ; G02B21/14

Abstract:
A complex amplitude information measurement apparatus (10) according to the present invention includes pixel sensor groups for generating a difference from one pixel sensor group to another in the optical distance of object light traveling from a measurement object (100); a camera (15) provided with an image sensor for recording, with a single-shot exposure, the object light that has passed through or been reflected from the pixel sensor groups to obtain intensity information of the measurement object; and a computer (16) for computing, on the basis of the intensity information, phase information of the measurement object (100).
Public/Granted literature
- US20160061656A1 MEASUREMENT DEVICE Public/Granted day:2016-03-03
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