Invention Grant
- Patent Title: MEMS scan controlled keystone and distortion correction
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Application No.: US14987010Application Date: 2016-01-04
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Publication No.: US10009585B2Publication Date: 2018-06-26
- Inventor: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
- Applicant: Microvision, Inc.
- Applicant Address: US WA Redmond
- Assignee: Microvision, Inc.
- Current Assignee: Microvision, Inc.
- Current Assignee Address: US WA Redmond
- Agent Kevin D. Wills
- Main IPC: G03B21/14
- IPC: G03B21/14 ; H04N9/31

Abstract:
Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
Public/Granted literature
- US20170195647A1 MEMS Scan Controlled Keystone and Distortion Correction Public/Granted day:2017-07-06
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