MEMS scan controlled keystone and distortion correction

    公开(公告)号:US10218951B2

    公开(公告)日:2019-02-26

    申请号:US15983508

    申请日:2018-05-18

    Abstract: Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.

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