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公开(公告)号:US20170195647A1
公开(公告)日:2017-07-06
申请号:US14987010
申请日:2016-01-04
Applicant: Microvision, Inc.
Inventor: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
CPC classification number: H04N9/3185 , G03B21/147 , H04N9/3129 , H04N9/3135 , H04N9/315 , H04N9/3194
Abstract: Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
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公开(公告)号:US10218951B2
公开(公告)日:2019-02-26
申请号:US15983508
申请日:2018-05-18
Applicant: Microvision, Inc.
Inventor: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
Abstract: Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
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公开(公告)号:US20180270459A1
公开(公告)日:2018-09-20
申请号:US15983508
申请日:2018-05-18
Applicant: Microvision, Inc.
Inventor: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
CPC classification number: H04N9/3185 , G03B21/147 , H04N9/3129 , H04N9/3135 , H04N9/315 , H04N9/3194
Abstract: Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
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公开(公告)号:US10009585B2
公开(公告)日:2018-06-26
申请号:US14987010
申请日:2016-01-04
Applicant: Microvision, Inc.
Inventor: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
CPC classification number: H04N9/3185 , G03B21/147 , H04N9/3129 , H04N9/3135 , H04N9/315 , H04N9/3194
Abstract: Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
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