Invention Grant
- Patent Title: Monitor, integrated circuit and method for monitoring an integrated circuit
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Application No.: US15100037Application Date: 2013-12-09
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Publication No.: US10013327B2Publication Date: 2018-07-03
- Inventor: Alistair Paul Roberston , Andrew Edward Birnie , Thomas Henry Luedeke
- Applicant: Alistair Paul Roberston , Andrew Edward Birnie , Thomas Henry Luedeke
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2013/060753 WO 20131209
- International Announcement: WO2015/087110 WO 20150618
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G06F11/07 ; G06F1/32 ; G06F11/32 ; G06F11/34

Abstract:
The present invention provides a monitor, especially a wake up monitor, for monitoring an integrated circuit, the monitor comprising a first monitoring unit configured to monitor at least one input of the integrated circuit, a second monitoring unit configured to monitor at least one output of the integrated circuit, a measurement unit configured to measure the time elapsed between an event on the at least one input and a reaction to the event on the at least one output and configured to output an alert signal if the elapsed time exceeds a predetermined first time limit. The present invention furthermore discloses an integrated circuit and a method for monitoring an integrated circuit.
Public/Granted literature
- US20170031795A1 MONITOR, INTEGRATED CIRCUIT AND METHOD FOR MONITORING AN INTEGRATED CIRCUIT Public/Granted day:2017-02-02
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