Invention Grant
- Patent Title: Semiconductor device with less positional deviation between aperture and solder
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Application No.: US15316546Application Date: 2015-06-05
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Publication No.: US10014248B2Publication Date: 2018-07-03
- Inventor: Makoto Murai , Yuji Takaoka , Hiroyuki Yamada , Kazuki Sato , Makoto Imai
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY CORPORATION
- Current Assignee: SONY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chip Law Group
- Priority: JP2014-132334 20140627
- International Application: PCT/JP2015/066347 WO 20150605
- International Announcement: WO2015/198836 WO 20151230
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L23/00 ; H01L23/31 ; H01L21/48 ; H01L21/56

Abstract:
Provided is a semiconductor device that includes a semiconductor chip, and a packaging substrate on which the semiconductor chip is mounted. The semiconductor chip includes a chip body and a plurality of solder-including electrodes that are provided on an element-formation surface of the chip body. The packaging substrate includes a substrate body, and a plurality of wirings and a solder resist layer that are provided on a front surface of the substrate body. The solder resist layer is provided as a continuous layer on the front surface of the substrate body and the plurality of wirings, and has an aperture on each of the plurality of wirings. The aperture has a planar shape elongated in a lengthwise direction of the wiring inside the aperture, with a length of the aperture adjusted in accordance with a thermal expansion coefficient of the packaging substrate.
Public/Granted literature
- US20170162493A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2017-06-08
Information query
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