Invention Grant
- Patent Title: Method and apparatus for measuring MU-MIMO interference in mobile communication system
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Application No.: US14328612Application Date: 2014-07-10
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Publication No.: US10014976B2Publication Date: 2018-07-03
- Inventor: Youn Sun Kim , Ju Ho Lee , Hyo Jin Lee , Yong Jun Kwak , Young Bum Kim , Hyoung Ju Ji
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2013-0081180 20130710
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04B7/0413

Abstract:
One or more embodiments discloses a method of measuring interference by an evolved NodeB and an eNB device. The method includes configuring one or more first type interference measurement resources in a User Equipment (UE). The method also includes transmitting signals for a plurality of UEs within a cell range of the eNB to the one or more first type interference measurement resources. The method also includes receiving channel status information generated in accordance with a signal received in the one or more first type interference measurement resources.
Public/Granted literature
- US20150016291A1 METHOD AND APPARATUS FOR MEASURING MU-MIMO INTERFERENCE IN MOBILE COMMUNICATION SYSTEM Public/Granted day:2015-01-15
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