公开(公告)号：US20150016291A1

公开(公告)日：2015-01-15

申请号：US14328612

申请日：2014-07-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Youn Sun Kim ,  Ju Ho Lee ,  Hyo Jin Lee ,  Yong Jun Kwak ,  Young Bum Kim ,  Hyoung Ju Ji

IPC: H04W24/08

CPC classification number: H04L1/0027 ,  H04B7/0413 ,  H04L1/0026

Abstract: One or more embodiments discloses a method of measuring interference by an evolved NodeB and an eNB device. The method includes configuring one or more first type interference measurement resources in a User Equipment (UE). The method also includes transmitting signals for a plurality of UEs within a cell range of the eNB to the one or more first type interference measurement resources. The method also includes receiving channel status information generated in accordance with a signal received in the one or more first type interference measurement resources.

Abstract translation: 一个或多个实施例公开了一种测量演进的节点B和eNB设备的干扰的方法。 该方法包括在用户设备（UE）中配置一个或多个第一类型的干扰测量资源。 所述方法还包括将所述eNB的小区范围内的多个UE的信号发射到所述一个或多个第一类型干扰测量资源。 该方法还包括接收根据在一个或多个第一类型干扰测量资源中接收的信号产生的信道状态信息。

公开(公告)号：US10014976B2

公开(公告)日：2018-07-03

申请号：US14328612

申请日：2014-07-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Youn Sun Kim ,  Ju Ho Lee ,  Hyo Jin Lee ,  Yong Jun Kwak ,  Young Bum Kim ,  Hyoung Ju Ji

IPC: H04L1/00 ,  H04B7/0413

CPC classification number: H04L1/0027 ,  H04B7/0413 ,  H04L1/0026

Abstract: One or more embodiments discloses a method of measuring interference by an evolved NodeB and an eNB device. The method includes configuring one or more first type interference measurement resources in a User Equipment (UE). The method also includes transmitting signals for a plurality of UEs within a cell range of the eNB to the one or more first type interference measurement resources. The method also includes receiving channel status information generated in accordance with a signal received in the one or more first type interference measurement resources.