- 专利标题: Method and apparatus for correction of multiple EM sensor positions
-
申请号: US11528291申请日: 2006-09-27
-
公开(公告)号: US10016148B2公开(公告)日: 2018-07-10
- 发明人: Dun Alex Li , Vernon Thomas Jensen , Cristian Atria
- 申请人: Dun Alex Li , Vernon Thomas Jensen , Cristian Atria
- 申请人地址: US NY Schenectady
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: US NY Schenectady
- 代理机构: Fletcher Yoder, P.C.
- 主分类号: A61B5/06
- IPC分类号: A61B5/06 ; A61B6/00 ; A61B90/00
摘要:
In one aspect of the present technique, a method for selecting between a plurality of electromagnetic sensors to correct for one or more field distortions includes, in the presence of an electromagnetic field, acquiring signals representative of the location of a plurality of electromagnetic sensors. The method further includes selecting between the signals from the plurality of electromagnetic sensors based on one or more quality metrics. In another aspect of the present technique, a system for selecting an optimum EM sensor to correct for one or more field distortions includes a plurality of EM sensors and an additional EM sensor for transmitting or receiving signals representative of the location of each of the plurality of EM sensors. The system further includes a controller configured to acquire signals representative of the location of the plurality of EM sensors, and select between the signals from the plurality of EM sensors based on one or more quality metrics.
公开/授权文献
信息查询