Invention Grant
- Patent Title: Measuring instrument and surveying system
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Application No.: US15867892Application Date: 2018-01-11
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Publication No.: US10048063B2Publication Date: 2018-08-14
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2016-110129 20160601
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G06T11/60 ; G06T7/20 ; H04N7/18 ; G01C3/00

Abstract:
The invention provides a measuring instrument, which comprises an image pickup unit for acquiring an image of a range including an object to be measured, a distance measuring unit for two-dimensionally scanning a predetermined range in synchronization with an image acquisition and for measuring, an arithmetic control unit and an attitude detecting unit for detecting a tilt angle of the image pickup unit with respect to a horizontality, wherein the arithmetic control unit associates a measurement result and a detection result of the attitude detecting unit with each pixel on a scanning locus corresponding to an acquired image.
Public/Granted literature
- US20180135973A1 Measuring Instrument And Surveying System Public/Granted day:2018-05-17
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