Invention Grant
- Patent Title: Determining a state of memristors in a crossbar array
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Application No.: US15500052Application Date: 2015-02-24
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Publication No.: US10049732B2Publication Date: 2018-08-14
- Inventor: Yoocharn Jeon
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: VanCott
- International Application: PCT/US2015/017329 WO 20150224
- International Announcement: WO2016/137446 WO 20160901
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
In one example in accordance with the present disclosure a method of determining a state of a memristor in a crossbar array is described. In the method a bias voltage is applied to a target row line in the crossbar array, which bias voltage causes a bias current to pass through a target memristor along the target row line. The bias voltage is increased by a predetermined amount to a state voltage. A state current flowing through the target memristor is determined. The state current is based on the state voltage. A state of the target memristor is determined based on the state current.
Public/Granted literature
- US20170271004A1 DETERMINING A STATE OF MEMRISTORS IN A CROSSBAR ARRAY Public/Granted day:2017-09-21
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