- 专利标题: Infrared spectroscopic imaging microscope with an attenuated total reflection imaging sub-assembly
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申请号: US15270676申请日: 2016-09-20
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公开(公告)号: US10054782B2公开(公告)日: 2018-08-21
- 发明人: Jeremy Rowlette , Eric Kim
- 申请人: DAYLIGHT SOLUTIONS, INC.
- 申请人地址: US CA San Diego
- 专利权人: DAYLIGHT SOLUTIONS, INC
- 当前专利权人: DAYLIGHT SOLUTIONS, INC
- 当前专利权人地址: US CA San Diego
- 代理机构: Roeder & Broder LLP
- 代理商 Steven G. Roeder
- 主分类号: G02B21/36
- IPC分类号: G02B21/36 ; H04N5/33 ; G02B21/34 ; G02B21/06 ; G02B27/56 ; G02B21/02 ; G02B21/26 ; G02B7/00
摘要:
An imaging microscope for spectrally analyzing a sample includes (i) a laser source that generates an interrogation beam; (ii) an attenuated total reflection assembly that includes an ATR crystal and a sample holder that holds the sample in intimate contact with the ATR crystal; (iii) an objective lens assembly that collects a reflected beam and focuses the reflected beam; and (iv) a two dimensional image sensor that receives the focused, reflected beam and captures two dimensional image information that is used to generate an image of the sample, the image sensor being operable in the mid-infrared range.
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