Invention Grant
- Patent Title: Method of analyzing a fault of an electronic system
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Application No.: US14937989Application Date: 2015-11-11
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Publication No.: US10067813B2Publication Date: 2018-09-04
- Inventor: Jang-Hyuk An , Byoung-Ju Choi , Ji-Hyun Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do KR Seoul
- Assignee: Samsung Electronics Co., Ltd.,Ewha University-Industry Collaboration Foundation
- Current Assignee: Samsung Electronics Co., Ltd.,Ewha University-Industry Collaboration Foundation
- Current Assignee Address: KR Gyeonggi-do KR Seoul
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2015-0063622 20150507
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/30 ; G06F11/34 ; G06F11/36

Abstract:
In a method of analyzing a fault and/or error of an electronic system according to some example embodiments, a system call that accesses a hardware is replaced with a hooking system call including a code that executes the system call and a code that obtains monitoring information, the monitoring information including system call execution information and hardware performance information is obtained by executing the hooking system call when the hooking system call is called instead of the system call, and the monitoring information is recorded to analyze the fault/error of the electronic system based on the monitoring information.
Public/Granted literature
- US20160147587A1 METHOD OF ANALYZING A FAULT OF AN ELECTRONIC SYSTEM Public/Granted day:2016-05-26
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