Invention Grant
- Patent Title: Method and device for obtaining antenna engineering parameter and system
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Application No.: US15360702Application Date: 2016-11-23
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Publication No.: US10069186B2Publication Date: 2018-09-04
- Inventor: Yingzhe Li , Hongzhuo Zhang , Li Yang , Yang He
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd
- Current Assignee: Huawei Technologies Co., Ltd
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H01Q1/12 ; H01Q1/00 ; H04B17/10 ; G06T7/60 ; G06T7/73 ; G01B11/26

Abstract:
A method and device and a system are disclosed. The method may include: obtaining, by a measurement device, a first image that is obtained by photographing an antenna at a first position (101); mapping M characteristic points included in the first image into a first three-dimensional spatial coordinate system, to obtain M three-dimensional space points that are in the first three-dimensional spatial coordinate system and that have a mapping relationship with the M characteristic points (102), where a first mapping photographing direction is parallel to a direction of an axis in the first three-dimensional spatial coordinate system, and the first mapping photographing direction is obtained by mapping a photographing direction of photographing the first image into the first three-dimensional spatial coordinate system; and obtaining a downtilt of the antenna according to a first angle and/or obtaining an azimuth of the antenna according to a second angle (103).
Public/Granted literature
- US20170077586A1 Method and Device for Obtaining Antenna Engineering Parameter and System Public/Granted day:2017-03-16
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