Invention Grant
- Patent Title: Serial data link measurement and simulation system
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Application No.: US13758614Application Date: 2013-02-04
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Publication No.: US10073750B2Publication Date: 2018-09-11
- Inventor: John J. Pickerd , Kan Tan , Kalev Sepp , Sarah R. Boen
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash Graham & Dunn
- Agent Andrew J. Harrington
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/30 ; H04B3/46 ; H04L25/03

Abstract:
A serial data link measurement and simulation system for use on a test and measurement instrument presents on a display device. A main menu having elements representing a measurement circuit, a simulation circuit and a transmitter. The main menu includes processing flow lines pointing from the measurement circuit to the transmitter and from the transmitter to the simulation circuit. The main menu includes a source input to the measurement circuit and one or more test points from which waveforms may be obtained. The simulation circuit includes a receiver. The measurement and simulation circuits are defined by a user, and the transmitter is common to both circuits so all aspects of the serial data link system are tied together.
Public/Granted literature
- US20130332101A1 SERIAL DATA LINK MEASUREMENT AND SIMULATION SYSTEM Public/Granted day:2013-12-12
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