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1.发明公开公开(公告)号：US20240364432A1
公开(公告)日：2024-10-31
申请号：US18643943
申请日：2024-04-23
申请人： Tektronix, Inc.
CPC分类号： H04B17/0085 , H04B17/101 , H04B17/191
摘要： A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.
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公开(公告)号：US20240310413A1
公开(公告)日：2024-09-19
申请号：US18604102
申请日：2024-03-13
申请人： Tektronix, Inc.
CPC分类号： G01R1/203 , G01R1/06794
摘要： A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.
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公开(公告)号：US12092692B2
公开(公告)日：2024-09-17
申请号：US17345283
申请日：2021-06-11
申请人： Tektronix, Inc.
发明人： John J. Pickerd
IPC分类号： G01R31/319 , G01R13/02 , G01R31/317 , G06N20/00
CPC分类号： G01R31/31908 , G01R13/0272 , G01R31/31708 , G01R31/31905 , G06N20/00
摘要： A test and measurement instrument includes an input to receive a non-return-to-zero (NRZ) waveform signal from a device under test, a ramp generator to use the NRZ waveform signal to generate a ramp sweep signal, a gate to gate the ramp sweep signal and the NRZ waveform signal to produce gated X-axis and Y-axis data, and a display to display the gated X-axis and Y-axis data as a cyclic loop image. A method of generating a cyclic loop image includes receiving an input waveform, using the input waveform to generate a ramp sweep signal, gating the ramp sweep signal and the input waveform to produce gated X-axis and Y-axis data, and displaying the gated X-axis and Y-axis data as a cyclic loop image.
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4.发明公开公开(公告)号：US20240288474A1
公开(公告)日：2024-08-29
申请号：US18656487
申请日：2024-05-06
申请人： Tektronix, Inc.
IPC分类号： G01R13/02
CPC分类号： G01R13/0272 , G01R13/029
摘要： A reconfigurable, automatically self-adjusting test and measurement instrument includes an interface configured to receive one or more static data preconditions for data received in an input signal and one or more dynamic data preconditions for data received in the input signal, the one or more static data preconditions and dynamic data preconditions defining one or more rules for data received during an input signal acquisition period to conform; and one or more processors configured to receive the one or more static and dynamic data preconditions, configure testing parameters of the test and measurement instrument to satisfy the one or more static preconditions, acquire the input signal, and analyze data received in the input signal to determine whether the one or more dynamic data preconditions are met.
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公开(公告)号：USD1038798S1
公开(公告)日：2024-08-13
申请号：US29903042
申请日：2023-09-19
申请人： Tektronix, Inc.
设计人： Chris A. Valentine , Neil Clayton , David M. Ediger , Marc A. Gessford , Taylor S. K. Heen , Brian A. Hollenberg , Steve U. Reinhold , Prashanth Thota , Satya N. Whitlock
摘要： FIG. 1 is a top, front, right, isometric view of a test and measurement instrument with stand and battery showing the new design in a first operating position;
FIG. 2 is a top, rear, left isometric view thereof;
FIG. 3 is a front elevational view thereof
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a rear elevational view thereof;
FIG. 9 is a top, front, right, isometric view of a test and measurement instrument with stand and battery showing the new design a second operating position;
FIG. 10 is a top, rear, left isometric view thereof;
FIG. 11 is a front elevational view thereof
FIG. 12 is a left side elevational view thereof;
FIG. 13 is a right side elevational view thereof;
FIG. 14 is a top plan view thereof;
FIG. 15 is a bottom plan view thereof; and,
FIG. 16 is a rear elevational view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument with stand and battery, neither of which form any part of the claimed design.-
公开(公告)号：US20240243779A1
公开(公告)日：2024-07-18
申请号：US18412151
申请日：2024-01-12
申请人： Tektronix, Inc.
发明人： Kan Tan , Keith R. Tinsley , John J. Pickerd
IPC分类号： H04B7/04 , H04B7/0413
CPC分类号： H04B7/04013 , H04B7/0413
摘要： A method of characterizing a communication channel includes receiving a first signal from a set of transmitters reflected along a reflected channel from each element of a reconfigurable intelligent surface (RIS) set at a nominal angle, receiving a second signal reflected in the reflected channel from each element of the RIS set at an adjusted angle, using the first and second signals to determine a transfer function for a combined channel comprised of a reflected channel and a direct channel, and using the transfer function as an input to a machine learning network to determine optimized settings for the elements of the RIS. A communications system includes a set of transmitters, a reconfigurable intelligent surface (RIS), one or more receivers positioned to receive signals reflected by the RIS from the set of transmitters, and a machine learning system configured to produce optimized angles for elements of the RIS.
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7.发明公开公开(公告)号：US20240223200A1
公开(公告)日：2024-07-04
申请号：US18610198
申请日：2024-03-19
申请人： Tektronix, Inc.
发明人： Alexander Krauska
CPC分类号： H03M1/1014 , G01R13/0218 , G01R23/16
摘要： A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the low resolution ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.
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公开(公告)号：US20240214068A1
公开(公告)日：2024-06-27
申请号：US18595085
申请日：2024-03-04
申请人： Tektronix, Inc.
IPC分类号： H04B10/079 , G06N20/00 , H04B10/07 , H04B10/077 , H04B10/40 , H04B10/564 , H04B10/572 , H04B10/58
CPC分类号： H04B10/0795 , H04B10/0771 , H04B10/0775 , H04B10/0777 , G06N20/00 , H04B10/07 , H04B10/40 , H04B10/564 , H04B10/572 , H04B10/58
摘要： A method of training a machine learning system to determine operating parameters for optical transceivers includes connecting the transceiver to a test and measurement device, tuning the transceiver with a set of parameters, capturing a waveform from the transceiver, sending the waveform and the set of parameters to a machine learning system, and repeating the tuning, capturing, and sending until a sufficient number of samples are gathered.
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公开(公告)号：US20240184637A1
公开(公告)日：2024-06-06
申请号：US18523556
申请日：2023-11-29
申请人： Tektronix, Inc.
CPC分类号： G06F9/5077 , G06F11/362
摘要： A machine learning management system includes a repository having one or more partitions, the one or more partitions being separate from others of the partitions, a communications interface, and one or more processors configured to execute code to: receive a selected model and associated training data for the selected model through the communications interface from a customer; store the selected model and the associated training data in a partition dedicated to the customer; and manage the one or more partitions to ensure that the customer can only access the customer's partition. A method includes receiving a selected model and associated training data for the selected model from a customer, storing the selected model and the associated training data in a partition dedicated to the customer in a repository, and managing the one or more partitions to ensure that the customer can only access the partition dedicated to the customer.
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10.发明授权公开(公告)号：US11994967B2
公开(公告)日：2024-05-28
申请号：US17094677
申请日：2020-11-10
申请人： Tektronix, Inc.
发明人： Joshua J. O'Brien
CPC分类号： G06F11/26 , G06F11/221 , G06F13/20 , H04L1/0013 , H04L1/0015 , H04L1/203 , H04L7/0016 , H04L2001/0094
摘要： A test and measurement device includes an input port for receiving a bus conducting data from a device under test, and processing element coupled to the input port. The processing element is configured to execute instructions that cause the processing element to determine a data sequence from a signal of the bus received on a main channel of the device, and use information from at least one other signal of the bus on an auxiliary channel of the device based upon a protocol associated with the bus to adjust parameters for performing error detection on the data sequence. A method of performing error detection in a test instrument includes receiving, at an input port of the test instrument, a bus conducting a data sequence from a device under test, determining the data sequence from a signal of the bus received on a main channel of the test instrument, and using information from at least one other signal of the bus received on an auxiliary channel of the test instrument to perform error detection on the data sequence.
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