Invention Grant
- Patent Title: Rapid material analysis using LIBS spectroscopy
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Application No.: US15321143Application Date: 2015-06-19
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Publication No.: US10088425B2Publication Date: 2018-10-02
- Inventor: Steven G. Buckley , Darrick L. Niccum
- Applicant: TSI, INCORPORATED
- Applicant Address: US MN Shoreview
- Assignee: TSI, Incorporated
- Current Assignee: TSI, Incorporated
- Current Assignee Address: US MN Shoreview
- Agency: Kagan Binder, PLLC
- International Application: PCT/US2015/036617 WO 20150619
- International Announcement: WO2015/200111 WO 20151230
- Main IPC: B07C5/00
- IPC: B07C5/00 ; G01N21/71 ; B07C5/342 ; B07C5/36 ; G01J3/443

Abstract:
A LIBS measurement system is described herein that provides an orifice, aperture or opening in a substantially V-shaped chute or sleeve that allows access to the material to be analyzed from the underside of the chute. The laser beam is aimed through the hole and return light (signal) is collected through the hole by a photodetector assembly. A diverter device, which is located at an output end of the chute, diverts certain particles away from the chute upon receipt of an actuation signal.
Public/Granted literature
- US20170205354A1 RAPID MATERIAL ANALYSIS USING LIBS SPECTROSCOPY Public/Granted day:2017-07-20
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