Invention Grant
- Patent Title: Far-infrared detection using Weyl semimetals
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Application No.: US15656373Application Date: 2017-07-21
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Publication No.: US10090466B2Publication Date: 2018-10-02
- Inventor: Ching-Kit Chan , Patrick A. Lee , Netanel Lindner , Gil Refael , Qiong Ma , Suyang Xu , Nuh Gedik
- Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Smith Baluch LLP
- Main IPC: G01J1/44
- IPC: G01J1/44 ; G01J1/04 ; H01L49/00

Abstract:
The generation of photocurrent in an ideal two-dimensional Dirac spectrum is symmetry forbidden. In sharp contrast, a three-dimensional Weyl semimetal can generically support significant photocurrent due to the combination of inversion symmetry breaking and finite tilts of the Weyl spectrum. To realize this photocurrent, a noncentrosymmetric Weyl semimetal is coupled to a pair of electrodes and illuminated with circularly polarized light without any voltage applied to the Weyl semimetal. The wavelength of the incident light can range over tens of microns and can be adjusted by doping the Weyl semimetal to change its chemical potential.
Public/Granted literature
- US20180026185A1 FAR-INFRARED DETECTION USING WEYL SEMIMETALS Public/Granted day:2018-01-25
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