Invention Grant
- Patent Title: Auxiliary power supply test methods and electronic apparatus using the same
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Application No.: US15185331Application Date: 2016-06-17
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Publication No.: US10094887B2Publication Date: 2018-10-09
- Inventor: Woo-sung Lee , Hyoung-taek Lim , Chung-hyun Ryu , Jong-wook Jeong , Su-yong An
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Ward and Smith, P.A.
- Priority: KR10-2015-0124946 20150903
- Main IPC: G01R31/40
- IPC: G01R31/40 ; G01R31/36 ; H02J7/00

Abstract:
Provided are an auxiliary power supply test method and an electronic apparatus to which the same is applied. The auxiliary power supply test method includes: applying a charging disable signal, which interrupts a charging operation by an auxiliary power supply unit for a predetermined period of time, to the auxiliary power supply unit; monitoring a charging voltage of the auxiliary power supply unit in a time interval in which the charging disable signal is applied to the auxiliary power supply unit; determining whether the auxiliary power supply unit is defective, based on whether the monitored charging voltage is less than a predetermined threshold voltage, wherein the auxiliary power supply unit supplies auxiliary power, obtained based on the charging voltage, to a system power supply line in a case of a sudden power-off.
Public/Granted literature
- US20170067968A1 Auxiliary Power Supply Test Methods and Electronic Apparatus Using the Same Public/Granted day:2017-03-09
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