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1.发明申请公开(公告)号：US20170067968A1
公开(公告)日：2017-03-09
申请号：US15185331
申请日：2016-06-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Woo-sung Lee , Hyoung-taek Lim , Chung-hyun Ryu , Jong-wook Jeong , Su-yong An
CPC classification number: G01R31/40 , G01R19/16538 , G01R31/028 , G01R31/3631 , H02J7/0093 , H02J9/00
Abstract: Provided are an auxiliary power supply test method and an electronic apparatus to which the same is applied. The auxiliary power supply test method includes: applying a charging disable signal, which interrupts a charging operation by an auxiliary power supply unit for a predetermined period of time, to the auxiliary power supply unit; monitoring a charging voltage of the auxiliary power supply unit in a time interval in which the charging disable signal is applied to the auxiliary power supply unit; determining whether the auxiliary power supply unit is defective, based on whether the monitored charging voltage is less than a predetermined threshold voltage, wherein the auxiliary power supply unit supplies auxiliary power, obtained based on the charging voltage, to a system power supply line in a case of a sudden power-off.
Abstract translation: 提供了辅助电源测试方法和应用其的电子设备。 辅助电源测试方法包括：向辅助电源单元施加将辅助电源单元的充电操作中断预定时间段的充电禁止信号; 在对辅助电源单元施加充电禁止信号的时间间隔内监视辅助电源单元的充电电压; 基于所监视的充电电压是否小于预定阈值电压，确定辅助电源单元是否有故障，其中辅助电源单元将基于充电电压获得的辅助电力提供给系统电源线， 突然断电的情况。
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公开(公告)号：US10120593B2
公开(公告)日：2018-11-06
申请号：US15160212
申请日：2016-05-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-beom Byun , Hu Zhao , Jong-gyu Park , Do-il Kong , Chung-hyun Ryu , Eok-soo Shim
Abstract: A method of controlling a temperature of a non-volatile storage device includes determining whether the temperature of the non-volatile storage device is greater than a control engagement temperature, and adjusting a data I/O performance level P when the temperature of the non-volatile storage device is greater than the control engagement temperature. The non-volatile storage device may operate at the maximum performance level in a range in which the non-volatile storage device is protected from heat.
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公开(公告)号：US10094887B2
公开(公告)日：2018-10-09
申请号：US15185331
申请日：2016-06-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Woo-sung Lee , Hyoung-taek Lim , Chung-hyun Ryu , Jong-wook Jeong , Su-yong An
Abstract: Provided are an auxiliary power supply test method and an electronic apparatus to which the same is applied. The auxiliary power supply test method includes: applying a charging disable signal, which interrupts a charging operation by an auxiliary power supply unit for a predetermined period of time, to the auxiliary power supply unit; monitoring a charging voltage of the auxiliary power supply unit in a time interval in which the charging disable signal is applied to the auxiliary power supply unit; determining whether the auxiliary power supply unit is defective, based on whether the monitored charging voltage is less than a predetermined threshold voltage, wherein the auxiliary power supply unit supplies auxiliary power, obtained based on the charging voltage, to a system power supply line in a case of a sudden power-off.
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公开(公告)号：US20160342346A1
公开(公告)日：2016-11-24
申请号：US15160212
申请日：2016-05-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-beom Byun , Hu Zhao , Jong-gyu Park , Do-il Kong , Chung-hyun Ryu , Eok-soo Shim
Abstract: A method of controlling a temperature of a non-volatile storage device includes determining whether the temperature of the non-volatile storage device is greater than a control engagement temperature, and adjusting a data I/O performance level P when the temperature of the non-volatile storage device is greater than the control engagement temperature. The non-volatile storage device may operate at the maximum performance level in a range in which the non-volatile storage device is protected from heat.
Abstract translation: 控制非易失性存储装置的温度的方法包括：确定非易失性存储装置的温度是否大于控制接合温度，以及当非易失性存储装置的温度为非调制温度时调整数据I / O性能水平P， 易失性存储装置大于控制接合温度。 非易失性存储设备可以在非易失性存储设备被保护的范围内以最大性能水平操作。
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