Invention Grant
- Patent Title: Apparatuses and methods for comparing a current representative of a number of failing memory cells
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Application No.: US15840610Application Date: 2017-12-13
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Publication No.: US10095574B2Publication Date: 2018-10-09
- Inventor: Jae-Kwan Park
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/00 ; G06F11/07 ; G11C7/06 ; G11C7/10 ; G11C29/24

Abstract:
Apparatuses and methods for comparing a sense current representative of a number of failing memory cells of a group of memory cells and a reference current representative of a reference number of failing memory cells is provided. One such apparatus includes a comparator configured to receive the sense current and to receive the reference current. The comparator includes a sense current buffer configured to buffer the sense current and the comparator is further configured to provide an output signal having a logic level indicative of a result of the comparison.
Public/Granted literature
- US20180101427A1 APPARATUSES AND METHODS FOR COMPARING A CURRENT REPRESENTATIVE OF A NUMBER OF FAILING MEMORY CELLS Public/Granted day:2018-04-12
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