Invention Grant
- Patent Title: Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
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Application No.: US15162133Application Date: 2016-05-23
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Publication No.: US10096449B2Publication Date: 2018-10-09
- Inventor: Xin Man , Tatsuya Asahata , Atsushi Uemoto
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2013-182586 20130903
- Main IPC: H01J37/304
- IPC: H01J37/304 ; H01J37/22 ; G01N23/2202 ; G01N23/2251 ; G01N23/20091 ; H01J37/305 ; H01J37/28 ; H01J37/29 ; G01N1/32

Abstract:
A cross-section processing-and-observation method includes: a cross-section exposure step of irradiating a sample with a focused ion beam to expose a cross-section of the sample; a cross-sectional image acquisition step of irradiating the cross-section with an electron beam to acquire a cross-sectional image of the cross-section; and a step of repeatedly performing the cross-section exposure step and the cross-sectional image acquisition step along a predetermined direction of the sample at a setting interval to acquire a plurality of cross-sectional images of the sample. In the cross-sectional image acquisition step, a cross-sectional image is acquired under different condition settings for a plurality of regions of the cross-section.
Public/Granted literature
- US20160343541A1 CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION PROCESSING-AND-OBSERVATION APPARATUS Public/Granted day:2016-11-24
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