Invention Grant
- Patent Title: Method and device for measuring mura level of liquid crystal display device
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Application No.: US15234001Application Date: 2016-08-11
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Publication No.: US10114241B2Publication Date: 2018-10-30
- Inventor: Yisan Zhang , Chun Wang , Junsheng Chen , Yuanhui Guo , Yan Wang
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Anhui
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Anhui
- Agency: Brooks Kushman P.C.
- Priority: CN201610140930 20160311
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G02F1/13 ; G01J1/04 ; G01J1/16

Abstract:
The present disclosure provides a method and a device for measuring mura levels of liquid crystal display devices. The method includes steps of: acquiring correspondence between standard brightness data differences and standard mura levels; acquiring a measurement brightness data difference of a test image displayed by a to-be-tested liquid crystal display device before and after the measurement; and acquiring a mura level corresponding to the measurement brightness data difference in accordance with the correspondence.
Public/Granted literature
- US20170261776A1 METHOD AND DEVICE FOR MEASURING MURA LEVEL OF LIQUID CRYSTAL DISPLAY DEVICE Public/Granted day:2017-09-14
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