Invention Grant
- Patent Title: Method and system for bad pixel correction in image sensors
-
Application No.: US15421874Application Date: 2017-02-01
-
Publication No.: US10158815B2Publication Date: 2018-12-18
- Inventor: Yonathan Aflalo , Nathan Henri Levy
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0090853 20160718
- Main IPC: H04N5/367
- IPC: H04N5/367 ; H04N9/04 ; G06T3/40 ; G06K9/62 ; H04N5/378 ; G06T7/90

Abstract:
A method of detecting a bad pixel in an image sensor includes: determining, a first color of a center pixel of a Bayer patch output by the image sensor; extracting, a main patch, a first auxiliary patch, and a second auxiliary patch from the Bayer patch, having the first color, a second other color, and a third other color, respectively; generating a normalized patch of the first color from the main patch and the auxiliary patches that brings a level of the auxiliary patches to a level of the main patch; and detecting whether the center pixel of the Bayer patch is a bad pixel using the normalized patch.
Public/Granted literature
- US20180020173A1 METHOD AND SYSTEM FOR BAD PIXEL CORRECTION IN IMAGE SENSORS Public/Granted day:2018-01-18
Information query