- 专利标题: Method and apparatus for characterization of terahertz radiation
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申请号: US15524488申请日: 2015-11-04
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公开(公告)号: US10175111B2公开(公告)日: 2019-01-08
- 发明人: Tsuneyuki Ozaki , Gargi Sharma , Kanwarpal Singh
- 申请人: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- 申请人地址: CA Quebec
- 专利权人: Institut National de la Recherche Scientifique
- 当前专利权人: Institut National de la Recherche Scientifique
- 当前专利权人地址: CA Quebec
- 代理商 Gwendoline Bruneau
- 国际申请: PCT/CA2015/051133 WO 20151104
- 国际公布: WO2016/070273 WO 20160512
- 主分类号: G01J5/02
- IPC分类号: G01J5/02 ; G01J3/42 ; G01J3/02
摘要:
A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.
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