Invention Grant
- Patent Title: Measurement method and optical receptacle
-
Application No.: US15539337Application Date: 2015-12-17
-
Publication No.: US10184785B2Publication Date: 2019-01-22
- Inventor: Shimpei Morioka , Yuki Saito , Tadanobu Niimi
- Applicant: Enplas Corporation
- Applicant Address: JP Saitama
- Assignee: ENPLAS CORPORATION
- Current Assignee: ENPLAS CORPORATION
- Current Assignee Address: JP Saitama
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2014-263393 20141225
- International Application: PCT/JP2015/085298 WO 20151217
- International Announcement: WO2016/104302 WO 20160630
- Main IPC: G01B11/26
- IPC: G01B11/26 ; G01B11/06 ; H01L31/0232 ; G02B6/42

Abstract:
Provided is an optical receptacle (140) having an installation plane (141), an optical plane, and a reference plane (147). An inclination angle of the reference plane (147) with respect to the installation plane (141) is smaller than an inclination angle of the optical plane with respect to the installation plane (141). Then, a first inclination angle θ1 that is the inclination angle of the reference plane (147) with respect to the installation plane (141) and a second inclination angle θ2 that is an inclination angle of the optical plane with respect to the reference plane (147) are measured. Then, the first inclination angle θ1 is added to the second inclination angle θ2 to calculate a third inclination angle θ3 that is the inclination angle of the optical plane with respect to the installation plane (141).
Public/Granted literature
- US20170356738A1 MEASUREMENT METHOD AND OPTICAL RECEPTACLE Public/Granted day:2017-12-14
Information query