Invention Grant
- Patent Title: Defect signal to noise enhancement by reducing die to die process noise
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Application No.: US15352664Application Date: 2016-11-16
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Publication No.: US10186028B2Publication Date: 2019-01-22
- Inventor: Bjorn Brauer , James A. Smith
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hodgson Russ LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
Gray level histograms for a test image and a reference image are adjusted by histogram scaling. Parameters from the histogram scaling are applied to the test image and the reference image. After the parameters are applied, the reference image and the test image are compared to produce a difference image, such as by subtracting the reference image from the test image. Noise in the difference image can be reduced, which improves defect identification in the difference image. In addition, noisy structures in the difference image which are elongated in vertical or horizontal direction can be found. If the noise exceeds a certain threshold, the structures may not be inspected.
Public/Granted literature
- US20170169552A1 DEFECT SIGNAL TO NOISE ENHANCEMENT BY REDUCING DIE TO DIE PROCESS NOISE Public/Granted day:2017-06-15
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