Invention Grant
- Patent Title: Method and system for measuring a channel quality indicator, user equipment and base station
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Application No.: US15836360Application Date: 2017-12-08
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Publication No.: US10200104B2Publication Date: 2019-02-05
- Inventor: Jingyuan Sun , Yongxing Zhou , David Mazzarese , Xiaotao Ren
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: CN201110348361 20111107
- Main IPC: H04B7/06
- IPC: H04B7/06 ; H04L1/00 ; H04W24/08 ; H04W52/24 ; H04B17/345 ; H04B7/0456

Abstract:
Embodiments of the present invention provide a method and a system for measuring a channel quality indicator, a user equipment and a base station. The method includes: obtaining a channel quality indicator configuration, where the channel quality indicator configuration includes a first combination, and the first combination includes a valid signal processing manner and an interfering signal processing manner; performing valid signal processing and interfering signal processing according to the valid signal processing manner and the interfering signal processing manner in the first combination to obtain a valid signal and an interfering signal; performing channel quality indicator calculation according to the valid signal and the interfering signal to obtain a channel quality indicator; and feeding the channel quality indicator back to a base station.
Public/Granted literature
- US20180102823A1 METHOD AND SYSTEM FOR MEASURING A CHANNEL QUALITY INDICATOR, USER EQUIPMENT AND BASE STATION Public/Granted day:2018-04-12
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