- Patent Title: Rapid antimicrobial susceptibility test, based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and automated cell image analysis system therefor
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Application No.: US14883101Application Date: 2015-10-14
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Publication No.: US10208328B2Publication Date: 2019-02-19
- Inventor: Yong-Gyun Jung , Eun-Geun Kim , Jung Heon Yoo , Sunghoon Kwon , Jungil Choi , Hee Chan Kim , Jung Chan Lee , Eui Jong Kim , Sang Hoon Song , Sei Ick Joo , Ji Soo Lee
- Applicant: Quanta Matrix Co., Ltd.
- Applicant Address: KR Seoul
- Assignee: QUANTAMATRIX INC.
- Current Assignee: QUANTAMATRIX INC.
- Current Assignee Address: KR Seoul
- Agency: STIP Law Group, LLC
- Priority: KR10-2014-0138535 20141014
- Main IPC: C12Q1/18
- IPC: C12Q1/18

Abstract:
Provided are a rapid antimicrobial susceptibility test, based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and an automated cell image analysis system therefor. The antimicrobial susceptibility test is rapidly performed based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and this makes it possible to obtain highly reliable test results faster by six to seven times than the standard method recommended by Clinical and Laboratory Standards Institute (CLSI).
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