- Patent Title: Methods and apparatus for monitoring a level of a regulated source
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Application No.: US14748692Application Date: 2015-06-24
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Publication No.: US10209279B2Publication Date: 2019-02-19
- Inventor: Sam Tran , Jay M. Towne , P. Karl Scheller
- Applicant: ALLEGRO MICROSYSTEMS, LLC
- Applicant Address: US NH Manchester
- Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee Address: US NH Manchester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R19/165
- IPC: G01R19/165 ; G01R31/40 ; G01R31/28 ; G01R33/02 ; G01D5/14

Abstract:
A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated voltage and to a second regulated voltage. A first circuit responsive to the first regulated voltage and to the second regulated voltage generates a first error signal indicative of at least one of an overvoltage condition of the first regulated voltage and an undervoltage condition of the second regulated voltage. A second circuit responsive to the first regulated voltage and to the second regulated voltage generates a second error signal indicative of at least one of an undervoltage condition of the first regulated voltage and an overvoltage condition of the second regulated voltage. A method for monitoring the levels of first and second regulated sources is also provided.
Public/Granted literature
- US20160377663A1 METHODS AND APPARATUS FOR MONITORING A LEVEL OF A REGULATED SOURCE Public/Granted day:2016-12-29
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