Invention Grant
- Patent Title: Circuit and method for testing RF device and RF device with built-in testing circuit
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Application No.: US15865730Application Date: 2018-01-09
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Publication No.: US10209296B2Publication Date: 2019-02-19
- Inventor: Rong- Fa Kuo , Ming-Chih Peng
- Applicant: Alpha Networks Inc.
- Applicant Address: TW Hsinchu
- Assignee: ALPHA NETWORKS INC.
- Current Assignee: ALPHA NETWORKS INC.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Priority: TW103129993A 20140829
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
In a testing circuit performing a testing operation to detect an RF circuit characteristic, a first filter unit is provided, having a first external terminal electrically coupled to a testing signal and a second external terminal electrically coupled to an RF circuit of the RF device. The first filter unit is configured to allow the testing signal to enter the RF circuit while blocking an RF signal transmitted in the RF circuit from entering the testing circuit. In addition, a testing-result informing unit is provided, having an external input electrically coupled to the first external terminal, and generating an informing signal, which indicates a condition of the RF circuit according to an electric level at the external input.
Public/Granted literature
- US20180128871A1 CIRCUIT AND METHOD FOR TESTING RF DEVICE AND RF DEVICE WITH BUILT-IN TESTING CIRCUIT Public/Granted day:2018-05-10
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