- 专利标题: Piezoelectric device, inspection method for piezoelectric device, and liquid ejecting head
-
申请号: US15910535申请日: 2018-03-02
-
公开(公告)号: US10214015B2公开(公告)日: 2019-02-26
- 发明人: Katsutomo Tsukahara , Motoki Takabe , Eiju Hirai , Yoshihiro Hokari
- 申请人: Seiko Epson Corporation
- 申请人地址: JP
- 专利权人: Seiko Epson Corporation
- 当前专利权人: Seiko Epson Corporation
- 当前专利权人地址: JP
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: JP2016-011297 20160125
- 主分类号: B41J2/045
- IPC分类号: B41J2/045 ; B41J2/14 ; B41J2/16 ; H01L41/047 ; H01L41/09 ; H01L41/29
摘要:
A piezoelectric device includes a substrate that includes a piezoelectric element formed by stacking a piezoelectric layer, a first electrode and a second electrode such that the piezoelectric layer is interposed between the first electrode and the second electrode; and a wiring substrate that includes a driving element providing a signal for driving the piezoelectric element to the substrate. The substrate has an inspection region where a piezoelectric element for inspection which is a portion of the piezoelectric element is disposed. The wiring substrate has an electrode inspection region including an electrode to be inspected that is electrically connected to the piezoelectric element for inspection and is disposed on a surface side opposite to the substrate, and a flexible substrate mounting region which is disposed on the surface side opposite to the substrate, and is connected to a flexible substrate. In plan view from a stacking direction of the substrate and the wiring substrate, the inspection region partially overlaps at least one of the inspection electrode region and the flexible substrate mounting region.
公开/授权文献
信息查询
IPC分类: